简介
该高级断层扫描样品架是为透射电子显微镜（TEM）设计的革命性室温样品架，支持高倾斜角度和扩展视野。它允许在广泛的倾斜和平移范围内收集数据，即使在受限的极靴间隙几何结构中也是如此。通过结合不同倾斜角度下的二维数据集，可以获得三维重建，适用于生命和物理科学中的电子断层扫描以及需要高样品倾斜的任何应用。该样品架采用流线型样品夹持机制，消除了大多数样品架在高倾斜角度下产生的阴影问题，并能均匀分布力在样品上。
Ideal for room-temperature electron tomography
High-tilt angles
Optimized specimen clamping
Extended field of view
Easy, accurate specimen loading and centering
Large field of view at high-tilt angles
The Advanced Tomography Holder is a revolutionary room-temperature specimen holder for transmission electron microscopy (TEM) featuring high-tilt and extended field of view. It allows data collection over wide-tilt and translation ranges, even in restrictive pole-piece gap geometries.
Advances in microstructural characterization require the ability to analyze structure and chemistry in three dimensions. However, most TEM techniques are limited to producing two-dimensional information. Tomography on the other hand, combines two-dimensional data sets taken at various tilt angles to produce a three-dimensional reconstruction. The Advanced Tomography Holder is ideal for electron tomography in the life and physical sciences, as well as any other application requiring high specimen tilt.
No shadows
A streamlined specimen clamping mechanism eliminates the shadowing associated with most holders at high-tilt angles. The clamping mechanism accepts a standard 3 mm diameter TEM specimen and accommodates a wide range of specimen thicknesses. The specimen clamping mechanism produces an evenly distributed force on the specimen.
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